High coercivity FePt thin films with Ag intermediate layers deposited at 400°C

Z. L. Zhao, J. S. Chen, J. Ding, J. B. Yi, B. H. Liu, Jianping Wang

Research output: Contribution to journalArticle

5 Scopus citations

Abstract

L10 phase FePt thin films deposited on amorphous Corning glasses and single crystal MgO (100) substrates were investigated. Epitaxial growth of the FePt (001) films was observed on MgO substrate at a deposition temperature of 400°C. With ultrathin Ag intermediate layers deposited between FePt layers, the film structure changed from interconnection network to isolated-island character. The perpendicular coercivity of the FePt film increased to about 32 kOe with intermediate layers inserted. The improvement of the magnetic properties may be attributed to the formation of island structures by the additive Ag layers in the FePt films.

Original languageEnglish (US)
Pages (from-to)3337-3339
Number of pages3
JournalIEEE Transactions on Magnetics
Volume41
Issue number10
DOIs
StatePublished - Oct 1 2005

Keywords

  • Ag
  • Epitaxial growth
  • FePt
  • High coercivity
  • Intermediate layer
  • MgO
  • Perpendicular magnetic recording

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