Harmonic bounds in atomic force microscopy

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The paper addresses the problem of evaluating magnitude bounds on higher harmonics of the periodic tip oscillation in an Atomic Force Microscope (AFM). The suggested approach considers a class of nonlinearities well suited to the tip-sample interaction in AFMs, and reduces the bounding problem to an optimization problem. For a relaxation of the problem a solution in a closed form is provided and reduces the conservativeness of estimates existing in literature.

Original languageEnglish (US)
Title of host publicationProceedings of the 44th IEEE Conference on Decision and Control, and the European Control Conference, CDC-ECC '05
Pages8221-8226
Number of pages6
DOIs
StatePublished - 2005
Event44th IEEE Conference on Decision and Control, and the European Control Conference, CDC-ECC '05 - Seville, Spain
Duration: Dec 12 2005Dec 15 2005

Publication series

NameProceedings of the 44th IEEE Conference on Decision and Control, and the European Control Conference, CDC-ECC '05
Volume2005

Other

Other44th IEEE Conference on Decision and Control, and the European Control Conference, CDC-ECC '05
Country/TerritorySpain
CitySeville
Period12/12/0512/15/05

Fingerprint

Dive into the research topics of 'Harmonic bounds in atomic force microscopy'. Together they form a unique fingerprint.

Cite this