Guest editors' introduction: Reliability challenges in nano-CMOS design

Yu Cao, Pradip Bose, Jim Tschanz

Research output: Contribution to journalEditorialpeer-review

20 Scopus citations
Original languageEnglish (US)
Pages (from-to)6-7
Number of pages2
JournalIEEE Design and Test of Computers
Volume26
Issue number6
DOIs
StatePublished - 2009
Externally publishedYes

Cite this