@article{266732d9f64a4666af725b5eec1deb9c,
title = "Guest editors' introduction: Nanoscale memories pose unique challenges",
keywords = "DRAM, FeRAM, MRAM, PCRAM, SRAM, STT-RAM, design and test, eDRAM, embedded memories",
author = "Kim, \{Chris H.\} and Leland Chang",
year = "2011",
month = jan,
doi = "10.1109/MDT.2011.21",
language = "English (US)",
volume = "28",
pages = "6--8",
journal = "IEEE Design and Test of Computers",
issn = "0740-7475",
publisher = "IEEE Computer Society",
number = "1",
}