| Original language | English (US) |
|---|---|
| Article number | 5432317 |
| Pages (from-to) | 6-7 |
| Number of pages | 2 |
| Journal | IEEE Design and Test of Computers |
| Volume | 27 |
| Issue number | 2 |
| DOIs | |
| State | Published - Mar 2010 |
| Externally published | Yes |
Bibliographical note
Funding Information:With the support of the IEEE Electron Device Society, the ACM Special Interest Group in Design Automation, and the Semiconductor Research Corporation (SRC), we organized the first Compact Variability Modeling Workshop in 2008. The workshop’s goal was to bring together industry and academic experts with wide knowledge of device engineering, compact modeling, circuit design, and VLSI CAD so that they could address the challenges of variability. This special issue of IEEE Design & Test highlights, and expands upon, some of the presentations given at that workshop.