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Goodness-of-fit tests for GEE with correlated binary data
Wei Pan
Biostatistics
Research output
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Contribution to journal
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Article
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peer-review
47
Scopus citations
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Dive into the research topics of 'Goodness-of-fit tests for GEE with correlated binary data'. Together they form a unique fingerprint.
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Keyphrases
Goodness-of-fit Test
100%
Correlated Binary Data
100%
Simulation Study
50%
Logistic Regression
50%
Test Statistic
50%
Logistic Model
50%
Logistic Regression Model
50%
Binary Data
50%
Residual-based
50%
Pearson chi-square
50%
Continuous Covariate
50%
Unweighting
50%
Chi-square Goodness of Fit Test
50%
Mathematics
Goodness of Fit Test
100%
Binary Data
100%
Residuals
66%
Simulation Study
33%
Statistics
33%
Covariate
33%
Variance
33%
Test Statistic
33%
Logistic Regression Model
33%
Covariate Value
33%
Logistic Regression
33%
Logistic Model
33%
Marginals
33%
Real Data
33%
Chi-Square Goodness-of-Fit Test
33%