GNOMO: Greater-than-NOMinal V dd operation for BTI mitigation

Saket Gupta; Sachin S Sapatnekar

doi:10.1109/ASPDAC.2012.6164957

GNOMO: Greater-than-NOMinal V _dd operation for BTI mitigation

Saket Gupta, Sachin S Sapatnekar

Electrical and Computer Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

15 Scopus citations

Abstract

This paper presents a novel scheme for mitigating delay degradations in digital circuits due to bias temperature instability (BTI). The method works in two alternating phases. In the first, a greater-than-nominal supply voltage, V _dd,g is used, which causes a task to complete more quickly but causes greater aging than the nominal supply voltage, V _dd,n. In the second, the circuit is power-gated, enabling the BTI recovery phase. We demonstrate, both at the circuit and the architectural levels, that this approach can significantly mitigate aging for a small performance penalty.

Original language	English (US)
Title of host publication	ASP-DAC 2012 - 17th Asia and South Pacific Design Automation Conference
Pages	271-276
Number of pages	6
DOIs	https://doi.org/10.1109/ASPDAC.2012.6164957
State	Published - Apr 26 2012
Event	17th Asia and South Pacific Design Automation Conference, ASP-DAC 2012 - Sydney, NSW, Australia Duration: Jan 30 2012 → Feb 2 2012

Publication series

Name	Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC

Other

Other	17th Asia and South Pacific Design Automation Conference, ASP-DAC 2012
Country	Australia
City	Sydney, NSW
Period	1/30/12 → 2/2/12

Access

10.1109/ASPDAC.2012.6164957

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GNOMO : Greater-than-NOMinal V _dd operation for BTI mitigation. / Gupta, Saket; Sapatnekar, Sachin S.

ASP-DAC 2012 - 17th Asia and South Pacific Design Automation Conference. 2012. p. 271-276 6164957 (Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Gupta, S & Sapatnekar, SS 2012, GNOMO: Greater-than-NOMinal V _dd operation for BTI mitigation. in ASP-DAC 2012 - 17th Asia and South Pacific Design Automation Conference., 6164957, Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC, pp. 271-276, 17th Asia and South Pacific Design Automation Conference, ASP-DAC 2012, Sydney, NSW, Australia, 1/30/12. https://doi.org/10.1109/ASPDAC.2012.6164957

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