Genome resilience and prevalence of segmental duplications following fast neutron irradiation of soybean

Yung Tsi Bolon, Adrian O. Stec, Jean Michel Michno, Jeffrey Roessler, Pudota B. Bhaskar, Landon Ries, Austin A. Dobbels, Benjamin W. Campbell, Nathan P. Young, Justin E. Anderson, David M. Grant, James H. Orf, Seth L. Naeve, Gary J. Muehlbauer, Carroll P. Vance, Robert M. Stupar

Research output: Contribution to journalArticlepeer-review

45 Scopus citations


Fast neutron radiation has been used as a mutagen to develop extensive mutant collections. However, the genome-wide structural consequences of fast neutron radiation are not well understood. Here, we examine the genome-wide structural variants observed among 264 soybean [Glycine max (L.) Merrill] plants sampled from a large fast neutron-mutagenized population. While deletion rates were similar to previous reports, surprisingly high rates of segmental duplication were also found throughout the genome. Duplication coverage extended across entire chromosomes and often prevailed at chromosome ends. High-throughput resequencing analysis of selected mutants resolved specific chromosomal events, including the rearrangement junctions for a large deletion, a tandem duplication, and a translocation. Genetic mapping associated a large deletion on chromosome 10 with a quantitative change in seed composition for one mutant. A tandem duplication event, located on chromosome 17 in a second mutant, was found to cosegregate with a short petiole mutant phenotype, and thus may serve as an example of a morphological change attributable to a DNA copy number gain. Overall, this study provides insight into the resilience of the soybean genome, the patterns of structural variation resulting from fast neutron mutagenesis, and the utility of fast neutron-irradiated mutants as a source of novel genetic losses and gains.

Original languageEnglish (US)
Pages (from-to)967-981
Number of pages15
Issue number3
StatePublished - Nov 1 2014


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