Generating MC/DC adequate test sequences through model checking

Research output: Chapter in Book/Report/Conference proceedingConference contribution

31 Scopus citations

Abstract

We present a method for automatically generating test sequences to satisfy MC/DC like structural coverage criteria of software behavioral models specified in state-based formalisms. The use of temporal logic for characterizing test criteria and the application of model-checking techniques for generating test sequences to those criteria have been of interest in software verification research for some time. Nevertheless, criteria for which constraints span more than one test sequence, such as the modified condition/decision coverage (MC/DC) mandated for critical avionics software, cannot be characterized in terms of a single temporal property. This paper discusses a method for recasting two-sequence constraints in the original model as a single sequence constraint expressed in temporal logic on a slightly modified model. The test-sequence generated by a model-checker for the modified model can be easily separated into two different test-sequences for the original model, satisfying the given test criteria. The approach has been successful in generating MC/DC test sequences from a model of the mode-logic in a flight-guidance system.

Original languageEnglish (US)
Title of host publicationProceedings - 28th Annual NASA Goddard Software Engineering Workshop, SEW 2003
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages91-96
Number of pages6
ISBN (Electronic)0769520642, 9780769520643
DOIs
StatePublished - 2004
Event28th Annual NASA Goddard Software Engineering Workshop, SEW 2003 - Greenbelt, United States
Duration: Dec 3 2003Dec 4 2003

Publication series

NameProceedings - 28th Annual NASA Goddard Software Engineering Workshop, SEW 2003

Other

Other28th Annual NASA Goddard Software Engineering Workshop, SEW 2003
Country/TerritoryUnited States
CityGreenbelt
Period12/3/0312/4/03

Bibliographical note

Publisher Copyright:
© 2004 IEEE.

Fingerprint

Dive into the research topics of 'Generating MC/DC adequate test sequences through model checking'. Together they form a unique fingerprint.

Cite this