GaAs MOS Capacitors and Self-Aligned MOSFETs with HfO2 Gate Dielectrics

S. J. Koester, E. W. Kiewra, Yanning Sun, D. A. Neumayer, J. A. Ott, D. K. Sadana, D. J. Webb, J. Fompeyrine, J. P. Locquet, M. Sousa, R. Germann

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations
Original languageEnglish (US)
Title of host publication64th DRC 2006 - Device Research Conference
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages43-44
Number of pages2
ISBN (Electronic)0780397495, 9780780397491
StatePublished - 2006
Externally publishedYes
Event64th Device Research Conference, DRC 2006 - Parker, United States
Duration: Jun 26 2006Jun 28 2006

Publication series

NameDevice Research Conference - Conference Digest, DRC
ISSN (Print)1548-3770

Conference

Conference64th Device Research Conference, DRC 2006
Country/TerritoryUnited States
CityParker
Period6/26/066/28/06

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