Abstract
Isotopically controlled GaAs heterostructures have been used to study Ga self-diffusion with secondary-ion mass spectrometry. This approach probes a close to ideal random walk problem, free from perturbations such as electric fields, mechanical stresses, or chemical potentials. The Ga self-diffusion coefficient in intrinsic GaAs can be well described with D = (43 ± 25) exp [−4.24 ± 0.06 e V)/kB T] over 6 orders of magnitude between 800 and 1225 ° C under As-rich condition. No significant doping effects are observed in samples with their substrates doped with Te up to 4 × 1017 cm−3 or Zn up to 1 × 1019 cm−3. Our results substantiate some of the findings in recent theoretical work.
Original language | English (US) |
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Pages (from-to) | 2342-2345 |
Number of pages | 4 |
Journal | Physical review letters |
Volume | 76 |
Issue number | 13 |
DOIs | |
State | Published - 1996 |
Externally published | Yes |