Full recovery of electron damage in glass at ambient temperatures

K. A. Mkhoyan, J. Silcox, A. Ellison, D. Ast, R. Dieckmann

Research output: Contribution to journalArticlepeer-review

28 Scopus citations


An unusually complete recovery of extensive electron-beam-induced damage in a thin film of a CaO-Al2O3-SiO2 glass was discovered. Nanoscale measurements show that the Ca ions migrate about 10 nm away during irradiation and return during recovery. Oxygen atoms are trapped largely as molecular oxygen and do not migrate. Electron energy loss measurements demonstrate that the glass returns completely to the original compositional and structural state thus indicating that the glass is in a deep thermodynamic energy minimum.

Original languageEnglish (US)
Article number205506
JournalPhysical review letters
Issue number20
StatePublished - 2006


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