Frequency analysis of atomic force microscopes with repulsive-attractive interaction potentials

D. Materassi; M. Basso; R. Genesio

doi:10.1109/cdc.2004.1428934

Frequency analysis of atomic force microscopes with repulsive-attractive interaction potentials

D. Materassi, M. Basso, R. Genesio

Research output: Contribution to journal › Conference article › peer-review

6 Scopus citations

Abstract

The paper deals with harmonic balance analysis of tapping mode Atomic Force Microscopes. The separation-amplitude curve is analitically evaluated for a large class of common tip-sample interaction potentials. The proposed approach provides an useful insight of many nonlinear known phenomena with respect to fully numerical approaches.

Original language	English (US)
Article number	ThA09.5
Pages (from-to)	3059-3061
Number of pages	3
Journal	Proceedings of the IEEE Conference on Decision and Control
Volume	3
DOIs	https://doi.org/10.1109/cdc.2004.1428934
State	Published - 2004
Externally published	Yes
Event	2004 43rd IEEE Conference on Decision and Control (CDC) - Nassau, Bahamas Duration: Dec 14 2004 → Dec 17 2004

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10.1109/cdc.2004.1428934

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title = "Frequency analysis of atomic force microscopes with repulsive-attractive interaction potentials",

abstract = "The paper deals with harmonic balance analysis of tapping mode Atomic Force Microscopes. The separation-amplitude curve is analitically evaluated for a large class of common tip-sample interaction potentials. The proposed approach provides an useful insight of many nonlinear known phenomena with respect to fully numerical approaches.",

author = "D. Materassi and M. Basso and R. Genesio",

year = "2004",

doi = "10.1109/cdc.2004.1428934",

language = "English (US)",

volume = "3",

pages = "3059--3061",

journal = "Proceedings of the IEEE Conference on Decision and Control",

issn = "0743-1546",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

note = "2004 43rd IEEE Conference on Decision and Control (CDC) ; Conference date: 14-12-2004 Through 17-12-2004",

}

TY - JOUR

T1 - Frequency analysis of atomic force microscopes with repulsive-attractive interaction potentials

AU - Materassi, D.

AU - Basso, M.

AU - Genesio, R.

PY - 2004

Y1 - 2004

N2 - The paper deals with harmonic balance analysis of tapping mode Atomic Force Microscopes. The separation-amplitude curve is analitically evaluated for a large class of common tip-sample interaction potentials. The proposed approach provides an useful insight of many nonlinear known phenomena with respect to fully numerical approaches.

AB - The paper deals with harmonic balance analysis of tapping mode Atomic Force Microscopes. The separation-amplitude curve is analitically evaluated for a large class of common tip-sample interaction potentials. The proposed approach provides an useful insight of many nonlinear known phenomena with respect to fully numerical approaches.

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U2 - 10.1109/cdc.2004.1428934

DO - 10.1109/cdc.2004.1428934

M3 - Conference article

AN - SCOPUS:14244265021

SN - 0743-1546

VL - 3

SP - 3059

EP - 3061

JO - Proceedings of the IEEE Conference on Decision and Control

JF - Proceedings of the IEEE Conference on Decision and Control

M1 - ThA09.5

T2 - 2004 43rd IEEE Conference on Decision and Control (CDC)

Y2 - 14 December 2004 through 17 December 2004

ER -

Frequency analysis of atomic force microscopes with repulsive-attractive interaction potentials

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