Formation and characterization of single crystal Ni2MnGa thin films

  • J. W. Dong
  • , L. C. Chen
  • , S. McKernan
  • , J. Q. Xie
  • , M. T. Figus
  • , R. D. James
  • , C. J. Palmstrom

Research output: Contribution to journalConference articlepeer-review

12 Scopus citations

Abstract

In this paper, molecular beam epitaxial growth of Ni2MnGa single crystal layers on GaAs (001) using a NiGa interlayer is reported. X-ray diffraction and transmission electron microscopy confirmed an epitaxial relationship of Ni2MnGa [100][010] // GaAs [100][010] and a tetragonal structure of the film (a = b = 5.79 angstrom, c = 6.07 angstrom). Magnetic measurements using vibrating sample and superconducting quantum interference device magnetometers revealed an in-plane magnetization of approx. 200 emu/cm3 at room temperature and a Curie temperature of approx. 350 K. The martensitic phase transformation was observed to occur at approx. 250 K.

Original languageEnglish (US)
Pages (from-to)297-302
Number of pages6
JournalMaterials Research Society Symposium - Proceedings
Volume604
StatePublished - 2000
EventMaterials for Smart Systems III - Boston, MA, USA
Duration: Nov 30 1999Dec 2 1999

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