Fluctuation conductivity of Tl-Ba-Ca-Cu-O thin films

D. H. Kim, A. M. Goldman, J. H. Kang, K. E. Gray, R. T. Kampwirth

Research output: Contribution to journalArticlepeer-review

89 Scopus citations

Abstract

Measurements of the in-plane fluctuation-enhanced conductivity of c-axis oriented Tl-Ba-Ca-Cu-O thin films have been performed over the temperature range Tc to 240 K. The results were consistent with two-dimensional fluctuation theory and with a linear dependence of the normal resistivity on temperature down to (T-Tc)Tc0.03. A crossover to three-dimensional fluctuations close to Tc was not found. The width of the superconducting transition appears to be a measure of a distance over which layers fluctuate in a correlated manner.

Original languageEnglish (US)
Pages (from-to)12275-12278
Number of pages4
JournalPhysical Review B
Volume39
Issue number16
DOIs
StatePublished - 1989
Externally publishedYes

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