Abstract
We report on the electrical conductance of nanofibers of regioregular poly(3-hexylthiophene) (RRP3HT) as a function of gate-induced charge. Nanofibers of RRP3HT were deposited onto SiO2/Si substrates by casting from dilute p-xylene solutions. An analysis of the nanofibers by atomic force microscopy revealed fiber lengths of 0.2-5 μm, heights of 3-7 nm, and widths of approximately 15 nm. A field effect transistor geometry was used to probe the conductance of webs of nanofibers and single nanofibers; in these measurements, gold electrodes served as source and drain contacts, and the doped SiO2/Si substrate served as the gate. Temperature-dependent transport studies on webs of nanofibers revealed an activation energy of 108 meV at a gate-induced hole density of 3.8 × 1012 charges/cm2. Pretreating SiO2 with a hydrophobic hexamethyldisilazane (HMDS) layer reduced the activation energy to 65 meV at the same charge density. The turn-on gate voltage on treated and untreated substrates increased in magnitude with decreasing temperature. Conductance measurements on single nanofibers on HMDS-treated SiO2 yielded hole mobilities as high as 0.6 cm2/Vs with on/off current ratios greater than 103.
Original language | English (US) |
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Pages (from-to) | 2674-2680 |
Number of pages | 7 |
Journal | Journal of Polymer Science, Part B: Polymer Physics |
Volume | 41 |
Issue number | 21 |
DOIs | |
State | Published - Nov 1 2003 |
Keywords
- Atomic force microscopy (AFM)
- Charge transport
- Conducting polymers
- Field effect transistor
- Nanofibers
- Regioregular poly(3-hexylthiophene)