FePt fct-(001) texture prepared at lower temperature for high areal density perpendicular recording media

Yingfan Xu; J. S. Chen; Daoyang Dai; J. P. Wang

doi:10.1109/TMAG.2002.801827

FePt fct-(001) texture prepared at lower temperature for high areal density perpendicular recording media

Yingfan Xu, J. S. Chen, Daoyang Dai, J. P. Wang

Electrical and Computer Engineering

Research output: Contribution to journal › Conference article › peer-review

8 Scopus citations

Abstract

FePt thin films with face-centered-tetragonal (fct)-(001) texture has been prepared by magnetron sputtering at elevated temperatures from 350 °C to 450 °C. Cr_100-x Ru_x underlayer was used to induce the FePtfct-(001) texture. The dependence of the texture on Ru content and substrate temperature is investigated. Cr lattice constant was expanded by addition of Ru, resulting in a bigger lattice mismatch between the Cr(200)-FePt(001) planes. Greater fct phase with c axis oriented perpendicular to the film plane has been achieved in films with Cr₉₁ Ru₉ underlayer. This result may arise from the strain-enhanced preferred orientation. The increase of substrate temperature favors the formation of fct-(001) texture. However, higher substrate temperature results in less fct phase formation. This may be caused by the diffusion of Cr from underlayer into magnetic layer.

Original language	English (US)
Pages (from-to)	2042-2044
Number of pages	3
Journal	IEEE Transactions on Magnetics
Volume	38
Issue number	5 I
DOIs	https://doi.org/10.1109/TMAG.2002.801827
State	Published - Sep 2002
Event	2002 International Magnetics Conference (Intermag 2002) - Amsterdam, Netherlands Duration: Apr 28 2002 → May 2 2002

Keywords

FePt
High anisotropy
Perpendicular recording
fct-(001) texture

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10.1109/TMAG.2002.801827

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@article{cbedad632316479b89d52f5876172e19,

title = "FePt fct-(001) texture prepared at lower temperature for high areal density perpendicular recording media",

abstract = "FePt thin films with face-centered-tetragonal (fct)-(001) texture has been prepared by magnetron sputtering at elevated temperatures from 350 °C to 450 °C. Cr100-x Rux underlayer was used to induce the FePtfct-(001) texture. The dependence of the texture on Ru content and substrate temperature is investigated. Cr lattice constant was expanded by addition of Ru, resulting in a bigger lattice mismatch between the Cr(200)-FePt(001) planes. Greater fct phase with c axis oriented perpendicular to the film plane has been achieved in films with Cr91 Ru9 underlayer. This result may arise from the strain-enhanced preferred orientation. The increase of substrate temperature favors the formation of fct-(001) texture. However, higher substrate temperature results in less fct phase formation. This may be caused by the diffusion of Cr from underlayer into magnetic layer.",

keywords = "FePt, High anisotropy, Perpendicular recording, fct-(001) texture",

author = "Yingfan Xu and Chen, {J. S.} and Daoyang Dai and Wang, {J. P.}",

year = "2002",

month = sep,

doi = "10.1109/TMAG.2002.801827",

language = "English (US)",

volume = "38",

pages = "2042--2044",

journal = "IEEE Transactions on Magnetics",

issn = "0018-9464",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

number = "5 I",

note = "2002 International Magnetics Conference (Intermag 2002) ; Conference date: 28-04-2002 Through 02-05-2002",

}

TY - JOUR

T1 - FePt fct-(001) texture prepared at lower temperature for high areal density perpendicular recording media

AU - Xu, Yingfan

AU - Chen, J. S.

AU - Dai, Daoyang

AU - Wang, J. P.

PY - 2002/9

Y1 - 2002/9

N2 - FePt thin films with face-centered-tetragonal (fct)-(001) texture has been prepared by magnetron sputtering at elevated temperatures from 350 °C to 450 °C. Cr100-x Rux underlayer was used to induce the FePtfct-(001) texture. The dependence of the texture on Ru content and substrate temperature is investigated. Cr lattice constant was expanded by addition of Ru, resulting in a bigger lattice mismatch between the Cr(200)-FePt(001) planes. Greater fct phase with c axis oriented perpendicular to the film plane has been achieved in films with Cr91 Ru9 underlayer. This result may arise from the strain-enhanced preferred orientation. The increase of substrate temperature favors the formation of fct-(001) texture. However, higher substrate temperature results in less fct phase formation. This may be caused by the diffusion of Cr from underlayer into magnetic layer.

AB - FePt thin films with face-centered-tetragonal (fct)-(001) texture has been prepared by magnetron sputtering at elevated temperatures from 350 °C to 450 °C. Cr100-x Rux underlayer was used to induce the FePtfct-(001) texture. The dependence of the texture on Ru content and substrate temperature is investigated. Cr lattice constant was expanded by addition of Ru, resulting in a bigger lattice mismatch between the Cr(200)-FePt(001) planes. Greater fct phase with c axis oriented perpendicular to the film plane has been achieved in films with Cr91 Ru9 underlayer. This result may arise from the strain-enhanced preferred orientation. The increase of substrate temperature favors the formation of fct-(001) texture. However, higher substrate temperature results in less fct phase formation. This may be caused by the diffusion of Cr from underlayer into magnetic layer.

KW - FePt

KW - High anisotropy

KW - Perpendicular recording

KW - fct-(001) texture

UR - http://www.scopus.com/inward/record.url?scp=0036762585&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0036762585&partnerID=8YFLogxK

U2 - 10.1109/TMAG.2002.801827

DO - 10.1109/TMAG.2002.801827

M3 - Conference article

AN - SCOPUS:0036762585

SN - 0018-9464

VL - 38

SP - 2042

EP - 2044

JO - IEEE Transactions on Magnetics

JF - IEEE Transactions on Magnetics

IS - 5 I

T2 - 2002 International Magnetics Conference (Intermag 2002)

Y2 - 28 April 2002 through 2 May 2002

ER -

FePt fct-(001) texture prepared at lower temperature for high areal density perpendicular recording media

Abstract

Keywords

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