Femtosecond TEM: Imaging Nanoscale Materials Dynamics at Temporal Extremes

David Flannigan, Ryan Gnabasik, Yichao Zhang

Research output: Contribution to journalComment/debatepeer-review

Original languageEnglish (US)
Pages (from-to)1126-1127
JournalMicroscopy and Microanalysis
Volume26
Issue numberS2
DOIs
StatePublished - Aug 1 2020

MRSEC Support

  • Partial

Cite this