Abstract
We report simulations of the response of InSb, GaAs, and Si to 70-femtosecond laser pulses of various intensities. In agreement with the experiments of Mazur and coworkers, and other groups, there is a nonthermal phase transition for each of these semiconductors above a threshold intensity. Our simulations employ tight-binding electron-ion dynamics (TED), a technique which is briefly described in the text. In the experimental pump-probe observations, the dielectric function ε (ω) and the second-order susceptibility χ(2) can be measured. These same quantities can be calculated during a TED simulation, and there is good agreement in the behavior with respect to both time and frequency. The simulations provide much additional microscopic information which is experimentally inaccessible: for example, the time-dependence of the atomic pair-correlation function, electronic energy bands, occupancies of excited states, kinetic energy of the atoms, and excursions of atoms from their initial positions.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 123-137 |
| Number of pages | 15 |
| Journal | Proceedings of SPIE - The International Society for Optical Engineering |
| Volume | 4280 |
| DOIs | |
| State | Published - 2001 |
| Event | Ultrafast Phenomena in Semiconductors V - San Jose, CA, United States Duration: Jan 25 2001 → Jan 26 2001 |
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