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FDSOI CMOS with dual backgate control for performance and power modulation

  • Jeng Bang Yau
  • , Jin Cai
  • , Leathen Shi
  • , Robert H. Dennard
  • , Arvind Kumar
  • , Katherine L. Saenger
  • , Alexander Reznicek
  • , Paul M. Solomon
  • , Qiqing Ouyang
  • , Steven Koester
  • , Wilfried E. Haensch

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We demonstrate, for the first time, modulation of power-performance of a ring oscillator fabricated on thin-BOX (buried oxide) FD (fully-depleted) SOI using independent backgate controls for nFET and pFET. The thin BOX facilities an effective modulation of ring characteristics with small (1-2V) independent backgate voltages. Leakage current per stage can be reduced by more than 100x with 30% increase of inverter delay. In addition the inverter delay can be improved by 15% with 2x increase of the stand-by current. Compatible with conventional CMOS process, our results suggest the backgate technology, an additional knob for power/performance optimization and variability control, is attractive for continued CMOS scaling.

Original languageEnglish (US)
Title of host publication2009 International Symposium on VLSI Technology, Systems, and Applications, VLSI-TSA '09
Pages84-85
Number of pages2
DOIs
StatePublished - Dec 1 2009
Event2009 International Symposium on VLSI Technology, Systems, and Applications, VLSI-TSA '09 - Hsinchu, Taiwan, Province of China
Duration: Apr 27 2009Apr 29 2009

Publication series

NameInternational Symposium on VLSI Technology, Systems, and Applications, Proceedings

Other

Other2009 International Symposium on VLSI Technology, Systems, and Applications, VLSI-TSA '09
Country/TerritoryTaiwan, Province of China
CityHsinchu
Period4/27/094/29/09

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