Abstract
A methodology for evaluating the fault coverage of RAM test algorithms is proposed and the architecture of a flexible software analysis program is described. The analysis, performed for arbitrary test sequences, provides a comprehensive set of coverage statistics for functional cell-array faults. An overview of the analysis capabilities of the program is given, the fault state-transition conditions for several representative fault classes are specified, and coverage analysis results for a variety of test algorithms are presented.
| Original language | English (US) |
|---|---|
| Title of host publication | Proceedings of the IEEE VLSI Test Symposium |
| Pages | 227-234 |
| Number of pages | 8 |
| State | Published - Jan 1 1995 |
| Event | Proceedings of the 13th IEEE VLSI Test Symposium - Princeton, NJ, USA Duration: Apr 30 1995 → May 3 1995 |
Other
| Other | Proceedings of the 13th IEEE VLSI Test Symposium |
|---|---|
| City | Princeton, NJ, USA |
| Period | 4/30/95 → 5/3/95 |
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