TY - GEN
T1 - Fast comparisons of circuit implementations
AU - Karandikar, Shrirang K.
AU - Sapatnekar, Sachin S.
N1 - Copyright:
Copyright 2010 Elsevier B.V., All rights reserved.
PY - 2004
Y1 - 2004
N2 - Digital designs can be mapped to different implementations using diverse approaches, with varying cost criteria. Post-processing transforms, such as transistor sizing can drastically improve circuit performance, by optimizing critical paths to meet timing specifications. However, most transistor sizing tools have high execution times, and the attainable circuit delay can be determined only after running the tool. In this paper, we present an approach for fast transistor sizing that can enable a designer to choose one among several functionally identical implementations. Our algorithm computes the minimum achievable delay of a circuit with a maximum average error of 5.5% in less than a second for even the largest benchmarks.
AB - Digital designs can be mapped to different implementations using diverse approaches, with varying cost criteria. Post-processing transforms, such as transistor sizing can drastically improve circuit performance, by optimizing critical paths to meet timing specifications. However, most transistor sizing tools have high execution times, and the attainable circuit delay can be determined only after running the tool. In this paper, we present an approach for fast transistor sizing that can enable a designer to choose one among several functionally identical implementations. Our algorithm computes the minimum achievable delay of a circuit with a maximum average error of 5.5% in less than a second for even the largest benchmarks.
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U2 - 10.1109/DATE.2004.1269005
DO - 10.1109/DATE.2004.1269005
M3 - Conference contribution
AN - SCOPUS:3042517220
SN - 0769520855
SN - 9780769520858
T3 - Proceedings - Design, Automation and Test in Europe Conference and Exhibition
SP - 910
EP - 915
BT - Proceedings - Design, Automation and Test in Europe Conference and Exhibition, DATE 04
A2 - Gielen, G.
A2 - Figueras, J.
T2 - Proceedings - Design, Automation and Test in Europe Conference and Exhibition, DATE 04
Y2 - 16 February 2004 through 20 February 2004
ER -