Fast and accurate estimation of nano-scaled SRAM read failure probability using Critical Point Sampling

Keyphrases

• Accurate Estimation 100%
• Analytical Method 33%
• Challenging Tasks 33%
• Computational Speed 33%
• Design Time 33%
• Estimation Method 33%
• Failure Probability 100%
• Failure Probability Estimation 33%
• Fast Estimation 100%
• Nano-Scale SRAM 33%
• Overall Design 33%
• Point Sampling 100%
• Quasi-analytical 33%
• Reading Failure 100%
• Sampling Methods 33%
• SRAM Cell 33%
• SRAM Reliability 33%

Engineering

• Critical Point 100%
• Design Time 50%
• Failure Probability 100%
• Nanoscale 50%
• Probability Estimation 50%
• Process Parameter 50%
• Sampling Technique 50%

Computer Science

• Critical Point 100%
• Estimation Method 50%
• In-Process 50%
• Point Sampling 100%
• Probability Estimation 50%
• Sampling Technique 50%