Extreme Temperature Characterization of Amplifier Response up to 300 Degrees Celsius Using Integrated Heaters and On-chip Samplers

Hanzhao Yu; Gyusung Park; Chris H. Kim

doi:10.1109/ESSCIRC53450.2021.9567760

Extreme Temperature Characterization of Amplifier Response up to 300 Degrees Celsius Using Integrated Heaters and On-chip Samplers

Hanzhao Yu, Gyusung Park, Chris H. Kim

Electrical and Computer Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

1 Scopus citations

Abstract

An on-chip analog waveform sampling system was demonstrated in a 65nm process focusing on extreme temperature step response measurements. Amplifier output waveforms were measured under different temperatures ranging from -40 degrees Celsius ambient temperature to 300 degrees Celsius heater temperature. For reliability testing, the amplifiers were stressed at a 1.6x supply voltage and a 350 degrees Celsius stress temperature for 100 hours.

Original language	English (US)
Title of host publication	ESSCIRC 2021 - IEEE 47th European Solid State Circuits Conference, Proceedings
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	411-414
Number of pages	4
ISBN (Electronic)	9781665437479
DOIs	https://doi.org/10.1109/ESSCIRC53450.2021.9567760
State	Published - Sep 13 2021
Event	47th IEEE European Solid State Circuits Conference, ESSCIRC 2021 - Virtual, Online, France Duration: Sep 6 2021 → Sep 9 2021

Publication series

Name	ESSCIRC 2021 - IEEE 47th European Solid State Circuits Conference, Proceedings

Conference

Conference	47th IEEE European Solid State Circuits Conference, ESSCIRC 2021
Country/Territory	France
City	Virtual, Online
Period	9/6/21 → 9/9/21

Bibliographical note

Publisher Copyright:
© 2021 IEEE.

Keywords

Analog waveform
extreme temperature
reliability testing
sub-sampling

Publisher link

10.1109/ESSCIRC53450.2021.9567760

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Yu, H., Park, G., & Kim, C. H. (2021). Extreme Temperature Characterization of Amplifier Response up to 300 Degrees Celsius Using Integrated Heaters and On-chip Samplers. In ESSCIRC 2021 - IEEE 47th European Solid State Circuits Conference, Proceedings (pp. 411-414). (ESSCIRC 2021 - IEEE 47th European Solid State Circuits Conference, Proceedings). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ESSCIRC53450.2021.9567760

Extreme Temperature Characterization of Amplifier Response up to 300 Degrees Celsius Using Integrated Heaters and On-chip Samplers. / Yu, Hanzhao; Park, Gyusung; Kim, Chris H.
ESSCIRC 2021 - IEEE 47th European Solid State Circuits Conference, Proceedings. Institute of Electrical and Electronics Engineers Inc., 2021. p. 411-414 (ESSCIRC 2021 - IEEE 47th European Solid State Circuits Conference, Proceedings).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Yu, H, Park, G & Kim, CH 2021, Extreme Temperature Characterization of Amplifier Response up to 300 Degrees Celsius Using Integrated Heaters and On-chip Samplers. in ESSCIRC 2021 - IEEE 47th European Solid State Circuits Conference, Proceedings. ESSCIRC 2021 - IEEE 47th European Solid State Circuits Conference, Proceedings, Institute of Electrical and Electronics Engineers Inc., pp. 411-414, 47th IEEE European Solid State Circuits Conference, ESSCIRC 2021, Virtual, Online, France, 9/6/21. https://doi.org/10.1109/ESSCIRC53450.2021.9567760

Yu H, Park G, Kim CH. Extreme Temperature Characterization of Amplifier Response up to 300 Degrees Celsius Using Integrated Heaters and On-chip Samplers. In ESSCIRC 2021 - IEEE 47th European Solid State Circuits Conference, Proceedings. Institute of Electrical and Electronics Engineers Inc. 2021. p. 411-414. (ESSCIRC 2021 - IEEE 47th European Solid State Circuits Conference, Proceedings). doi: 10.1109/ESSCIRC53450.2021.9567760

Yu, Hanzhao ; Park, Gyusung ; Kim, Chris H. / Extreme Temperature Characterization of Amplifier Response up to 300 Degrees Celsius Using Integrated Heaters and On-chip Samplers. ESSCIRC 2021 - IEEE 47th European Solid State Circuits Conference, Proceedings. Institute of Electrical and Electronics Engineers Inc., 2021. pp. 411-414 (ESSCIRC 2021 - IEEE 47th European Solid State Circuits Conference, Proceedings).

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Extreme Temperature Characterization of Amplifier Response up to 300 Degrees Celsius Using Integrated Heaters and On-chip Samplers

Abstract

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