TY - JOUR
T1 - Experimental study of stochastic resonance in atomic force microscopes
AU - Rajaram, Rajeev
AU - Salapaka, M. V.
AU - Basso, M.
AU - Dahleh, M.
PY - 2000
Y1 - 2000
N2 - Stochastic resonance (SR) is an interesting phenomenon which can occur in bistable systems subject to periodic and random forcing. This effect produces an improvement in the sensitivity of the bistable system to the periodic signal. In this paper, stochastic resonance for Atomic Force Microscope (AFM) is studied. The experimental results indicate that the AFM can be modeled as a bistable system similar to the Schmitt trigger, for which stochastic resonance has been well studied. The results indicate that stochastic resonance in AFM can be applied in many technological contexts as, for example, in the analysis of the effects of thermal noise in order to optimize the achievable resolution for imaging.
AB - Stochastic resonance (SR) is an interesting phenomenon which can occur in bistable systems subject to periodic and random forcing. This effect produces an improvement in the sensitivity of the bistable system to the periodic signal. In this paper, stochastic resonance for Atomic Force Microscope (AFM) is studied. The experimental results indicate that the AFM can be modeled as a bistable system similar to the Schmitt trigger, for which stochastic resonance has been well studied. The results indicate that stochastic resonance in AFM can be applied in many technological contexts as, for example, in the analysis of the effects of thermal noise in order to optimize the achievable resolution for imaging.
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U2 - 10.1109/acc.2000.879577
DO - 10.1109/acc.2000.879577
M3 - Article
AN - SCOPUS:0034546156
SN - 0743-1619
VL - 3
SP - 2129
EP - 2133
JO - Proceedings of the American Control Conference
JF - Proceedings of the American Control Conference
ER -