TY - JOUR
T1 - Excitonic singlet-triplet ratios in molecular and polymeric organic materials
AU - Segal, M.
AU - Baldo, A.
AU - Holmes, J.
AU - Forrest, R.
AU - Soos, G.
PY - 2003
Y1 - 2003
N2 - A simple technique employing reverse bias measurements of photoluminescent efficiency is described to determine the excitonic singlet-triplet formation statistics of electroluminescent organic thin films. Using this method, the singlet fractions in thin films of two organic emissive materials commonly used in organic light emitting devices, tris(8-hydroxyquinoline) aluminum (Alq3) and poly[2-methoxy-5-(2-ethylhexyloxy)-1,4-phenylenevinylene] (MEH-PPV), are found to be (20±1)% and (20±4)%, respectively. Results are confirmed using a sensitive synchronous detection scheme. We discuss other measurements and the current understanding of exciton formation statistics in polymeric and small molecular weight organic electroluminescent materials.
AB - A simple technique employing reverse bias measurements of photoluminescent efficiency is described to determine the excitonic singlet-triplet formation statistics of electroluminescent organic thin films. Using this method, the singlet fractions in thin films of two organic emissive materials commonly used in organic light emitting devices, tris(8-hydroxyquinoline) aluminum (Alq3) and poly[2-methoxy-5-(2-ethylhexyloxy)-1,4-phenylenevinylene] (MEH-PPV), are found to be (20±1)% and (20±4)%, respectively. Results are confirmed using a sensitive synchronous detection scheme. We discuss other measurements and the current understanding of exciton formation statistics in polymeric and small molecular weight organic electroluminescent materials.
UR - https://www.scopus.com/pages/publications/2442519975
UR - https://www.scopus.com/pages/publications/2442519975#tab=citedBy
U2 - 10.1103/PhysRevB.68.075211
DO - 10.1103/PhysRevB.68.075211
M3 - Article
AN - SCOPUS:2442519975
SN - 1098-0121
VL - 68
JO - Physical Review B - Condensed Matter and Materials Physics
JF - Physical Review B - Condensed Matter and Materials Physics
IS - 7
ER -