Evolution of in-plane magnetic anisotropy in sputtered FeTaN/TaN/FeTaN sandwich films

H. B. Nie; C. K. Ong; J. P. Wang; Z. W. Li

doi:10.1063/1.1555365

Evolution of in-plane magnetic anisotropy in sputtered FeTaN/TaN/FeTaN sandwich films

H. B. Nie
, C. K. Ong
, J. P. Wang
, Z. W. Li

Electrical and Computer Engineering

Research output: Contribution to journal › Article › peer-review

11 Scopus citations

Abstract

The evolution of in-plane magnetic anisotropy in sputtered FeTaN/TaN/FeTaN sandwich films was studied. The magnetic properties, crystalline structures, microstructures, and surface morphologies of the as-deposited sample were characterized by using angle resolved M-H loops tracer, VSM, XRD, TEM, AES, and AFM. Magnetostatic and interface anisotropies may be the major reasons to cause biaxial anisotropy in the sandwiches, in which magnetostatic anisotropy is the dominant one.

Original language	English (US)
Pages (from-to)	7252-7254
Number of pages	3
Journal	Journal of Applied Physics
Volume	93
Issue number	10 2
DOIs	https://doi.org/10.1063/1.1555365
State	Published - May 15 2003

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10.1063/1.1555365

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title = "Evolution of in-plane magnetic anisotropy in sputtered FeTaN/TaN/FeTaN sandwich films",

abstract = "The evolution of in-plane magnetic anisotropy in sputtered FeTaN/TaN/FeTaN sandwich films was studied. The magnetic properties, crystalline structures, microstructures, and surface morphologies of the as-deposited sample were characterized by using angle resolved M-H loops tracer, VSM, XRD, TEM, AES, and AFM. Magnetostatic and interface anisotropies may be the major reasons to cause biaxial anisotropy in the sandwiches, in which magnetostatic anisotropy is the dominant one.",

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T1 - Evolution of in-plane magnetic anisotropy in sputtered FeTaN/TaN/FeTaN sandwich films

AU - Nie, H. B.

AU - Ong, C. K.

AU - Wang, J. P.

AU - Li, Z. W.

PY - 2003/5/15

Y1 - 2003/5/15

N2 - The evolution of in-plane magnetic anisotropy in sputtered FeTaN/TaN/FeTaN sandwich films was studied. The magnetic properties, crystalline structures, microstructures, and surface morphologies of the as-deposited sample were characterized by using angle resolved M-H loops tracer, VSM, XRD, TEM, AES, and AFM. Magnetostatic and interface anisotropies may be the major reasons to cause biaxial anisotropy in the sandwiches, in which magnetostatic anisotropy is the dominant one.

AB - The evolution of in-plane magnetic anisotropy in sputtered FeTaN/TaN/FeTaN sandwich films was studied. The magnetic properties, crystalline structures, microstructures, and surface morphologies of the as-deposited sample were characterized by using angle resolved M-H loops tracer, VSM, XRD, TEM, AES, and AFM. Magnetostatic and interface anisotropies may be the major reasons to cause biaxial anisotropy in the sandwiches, in which magnetostatic anisotropy is the dominant one.

UR - https://www.scopus.com/pages/publications/0038313075

UR - https://www.scopus.com/pages/publications/0038313075#tab=citedBy

U2 - 10.1063/1.1555365

DO - 10.1063/1.1555365

M3 - Article

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EP - 7254

JO - Journal of Applied Physics

JF - Journal of Applied Physics

IS - 10 2

ER -

Evolution of in-plane magnetic anisotropy in sputtered FeTaN/TaN/FeTaN sandwich films

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