Evolution of in-plane magnetic anisotropy in sputtered FeTaN/TaN/FeTaN sandwich films

H. B. Nie, C. K. Ong, J. P. Wang, Z. W. Li

Research output: Contribution to journalArticle

9 Scopus citations

Abstract

The evolution of in-plane magnetic anisotropy in sputtered FeTaN/TaN/FeTaN sandwich films was studied. The magnetic properties, crystalline structures, microstructures, and surface morphologies of the as-deposited sample were characterized by using angle resolved M-H loops tracer, VSM, XRD, TEM, AES, and AFM. Magnetostatic and interface anisotropies may be the major reasons to cause biaxial anisotropy in the sandwiches, in which magnetostatic anisotropy is the dominant one.

Original languageEnglish (US)
Pages (from-to)7252-7254
Number of pages3
JournalJournal of Applied Physics
Volume93
Issue number10 2
DOIs
StatePublished - May 15 2003

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