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ESRU: Extremely Low-Bit and Hardware-Efficient Stochastic Rounding Unit Design for Low-Bit DNN Training

  • Sung En Chang
  • , Geng Yuan
  • , Alec Lu
  • , Mengshu Sun
  • , Yanyu Li
  • , Xiaolong Ma
  • , Zhengang Li
  • , Yanyue Xie
  • , Minghai Qin
  • , Xue Lin
  • , Zhenman Fang
  • , Yanzhi Wang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Stochastic rounding is crucial in the low-bit (e.g., 8-bit) training of deep neural networks (DNNs) to achieve high accuracy. One of the drawbacks of prior studies is that they require a large number of high-precision stochastic rounding units (SRUs) to guarantee low-bit DNN accuracy, which involves considerable hardware overhead. In this paper, we use extremely low-bit SRUs (ESRUs) to save a large number of hardware resources during low-bit DNN training. However, a naively designed ESRU introduces a biased distribution of random numbers, causing accuracy degradation. To address this issue, we further propose an ESRU design with a plateau-shape distribution. The plateau-shape distribution in our ESRU design is implemented with the combination of an LFSR (linear-feedback shift register) and an inverted LFSR, which avoids LFSR packing and turns an inherent LFSR drawback into an advantage in our efficient ESRU design. Experimental results using state-of-the-art DNN models demonstrate that, compared to the prior 24-bit SRU with 24-bit pseudo-random number generators (PRNG), our 8-bit ESRU with 3-bit PRNG reduces the SRU hardware resource usage by 9.75x while achieving slightly higher accuracy.

Original languageEnglish (US)
Title of host publication2023 Design, Automation and Test in Europe Conference and Exhibition, DATE 2023 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9783981926378
DOIs
StatePublished - 2023
Externally publishedYes
Event2023 Design, Automation and Test in Europe Conference and Exhibition, DATE 2023 - Antwerp, Belgium
Duration: Apr 17 2023Apr 19 2023

Publication series

NameProceedings -Design, Automation and Test in Europe, DATE
Volume2023-April
ISSN (Print)1530-1591

Conference

Conference2023 Design, Automation and Test in Europe Conference and Exhibition, DATE 2023
Country/TerritoryBelgium
CityAntwerp
Period4/17/234/19/23

Bibliographical note

Publisher Copyright:
© 2023 EDAA.

Keywords

  • DNNs
  • low-bit training
  • stochastic rounding

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