Erratum: Thermal dependence of the refractive index of GaAs and AlAs measured using semiconductor multilayer optical cavities (Appl. Phys. Lett. (1995) 66 (335) (10.1063/1.114204))

TY - JOUR

T1 - Erratum

T2 - Thermal dependence of the refractive index of GaAs and AlAs measured using semiconductor multilayer optical cavities (Appl. Phys. Lett. (1995) 66 (335) (10.1063/1.114204))

AU - Talghader, J.

AU - Smith, J. S.

PY - 1996/10/21

Y1 - 1996/10/21

UR - https://www.scopus.com/pages/publications/34047237563

UR - https://www.scopus.com/pages/publications/34047237563#tab=citedBy

U2 - 10.1063/1.118159

DO - 10.1063/1.118159

M3 - Comment/debate

AN - SCOPUS:34047237563

SN - 0003-6951

VL - 69

SP - 2608

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 17

ER -