Original language | English (US) |
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Pages (from-to) | 2608 |
Number of pages | 1 |
Journal | Applied Physics Letters |
Volume | 69 |
Issue number | 17 |
DOIs |
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State | Published - Oct 21 1996 |
Erratum: Thermal dependence of the refractive index of GaAs and AlAs measured using semiconductor multilayer optical cavities (Appl. Phys. Lett. (1995) 66 (335) (10.1063/1.114204))
J. Talghader, J. S. Smith
Research output: Contribution to journal › Comment/debate › peer-review
10
Scopus
citations