Erratum: Evolution of stress with film thickness in co films on inP(001) (IEEE Transactions on Magnetics (2009) 45:6 (2523-2526))

Yong Sung Park; Jong Ryul Jeong; Jong Seok Jeong; Jeong Yong Lee; Sung Chul Shin

doi:10.1109/TMAG.2009.2028370

Erratum: Evolution of stress with film thickness in co films on inP(001) (IEEE Transactions on Magnetics (2009) 45:6 (2523-2526))

Yong Sung Park, Jong Ryul Jeong, Jong Seok Jeong, Jeong Yong Lee, Sung Chul Shin

Chemical Engineering and Materials Science

Research output: Contribution to journal › Comment/debate › peer-review

Original language	English (US)
Article number	5208598
Pages (from-to)	3366
Number of pages	1
Journal	IEEE Transactions on Magnetics
Volume	45
Issue number	9
DOIs	https://doi.org/10.1109/TMAG.2009.2028370
State	Published - Sep 2009

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10.1109/TMAG.2009.2028370

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@article{4fb683f909d84b3aad43f108588e3b54,

title = "Erratum: Evolution of stress with film thickness in co films on inP(001) (IEEE Transactions on Magnetics (2009) 45:6 (2523-2526))",

author = "Park, {Yong Sung} and Jeong, {Jong Ryul} and Jeong, {Jong Seok} and Lee, {Jeong Yong} and Shin, {Sung Chul}",

year = "2009",

month = sep,

doi = "10.1109/TMAG.2009.2028370",

language = "English (US)",

volume = "45",

pages = "3366",

journal = "IEEE Transactions on Magnetics",

issn = "0018-9464",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

number = "9",

}

TY - JOUR

T1 - Erratum

T2 - Evolution of stress with film thickness in co films on inP(001) (IEEE Transactions on Magnetics (2009) 45:6 (2523-2526))

AU - Park, Yong Sung

AU - Jeong, Jong Ryul

AU - Jeong, Jong Seok

AU - Lee, Jeong Yong

AU - Shin, Sung Chul

PY - 2009/9

Y1 - 2009/9

UR - http://www.scopus.com/inward/record.url?scp=69649096116&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=69649096116&partnerID=8YFLogxK

U2 - 10.1109/TMAG.2009.2028370

DO - 10.1109/TMAG.2009.2028370

M3 - Comment/debate

AN - SCOPUS:69649096116

SN - 0018-9464

VL - 45

SP - 3366

JO - IEEE Transactions on Magnetics

JF - IEEE Transactions on Magnetics

IS - 9

M1 - 5208598

ER -

Erratum: Evolution of stress with film thickness in co films on inP(001) (IEEE Transactions on Magnetics (2009) 45:6 (2523-2526))

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