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Epitaxial La
0.5
Sr
0.5
CoO
3
thin films: Structure, magnetism, and transport
M. A. Torija
, M. Sharma
, M. R. Fitzsimmons
, M. Varela
,
C. Leighton
Chemical Engineering and Materials Science
Research output
:
Contribution to journal
›
Article
›
peer-review
72
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Scopus citations
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Dive into the research topics of 'Epitaxial La
0.5
Sr
0.5
CoO
3
thin films: Structure, magnetism, and transport'. Together they form a unique fingerprint.
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Keyphrases
Epitaxial
100%
Magnetic Phase Separation
100%
SrTiO3
100%
Structure-transport Relationship
100%
Thin Film Structure
100%
Thin Film Magnetism
100%
Low Temperature
66%
Magnetic Properties
66%
Magnetoresistance
66%
Curie Point Depth
66%
Structure-property Relationships
33%
Magnetism
33%
Electronic Properties
33%
Two Dimensional
33%
Film Formation
33%
Structural Properties
33%
Polarized Neutron Reflectometry
33%
Anisotropic Magnetoresistance
33%
Curie Temperature
33%
Bulk Phase
33%
(001) Substrate
33%
Spin Transition
33%
Gas Pressure
33%
Film Surface
33%
Oxygenation
33%
X-ray Reflectivity
33%
Epilayer
33%
La1-xSrxMnO3
33%
Resistivity
33%
Saturation Magnetization
33%
Crystal Quality
33%
Scanning Transmission Electron Microscopy
33%
Film-substrate Interface
33%
Lattice Mismatch
33%
Low Doping Concentration
33%
Depth Profile
33%
Inert Gas
33%
Comprehensive Investigation
33%
Strain Relaxation
33%
Thin Samples
33%
Chemical Profile
33%
Strain State
33%
Sputtering Gas
33%
Solid Oxide Fuel Cell
33%
DC Reactive Magnetron Sputtering
33%
Phase Purity
33%
Phase Potential
33%
Ferroelectric Memory
33%
Magnetic Depths
33%
Resputtering
33%
Magnetic Profile
33%
Oxygen Stoichiometry
33%
Temperature Dependence
33%
Dimensional Confinement
33%
Oxygen-induced
33%
Three-dimensional Growth
33%
Low Thickness
33%
Nonmetallic Phase
33%
Material Science
Magnetism
100%
Film
100%
Thin Film Structure
100%
Curie Temperature
50%
Magnetic Property
33%
Magnetoresistance
33%
Ferroelectric Material
16%
Electronic Property
16%
Inert Gas
16%
Anisotropic Magnetoresistance
16%
Electrical Resistivity
16%
Structural Property
16%
Magnetron Sputtering
16%
Scanning Transmission Electron Microscopy
16%
Lattice Mismatch
16%
Oxide Compound
16%
Thin Films
16%
Epilayers
16%
Structure-Property Relationship
16%