Abstract
Illustration of a new high-temperature hard-mask process based on traditional lithography and selective wet-etching of MgO. The hard mask is compatible with standard nano-lithography techniques and heat treatments in excess of 1000 °C. Here, this technique is applied to produce temperature-stable contacts that give rise to low leakage, improved fatigue properties, and excellent high-temperature stability in ferroelectric thin-film capacitors.
Original language | English (US) |
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Pages (from-to) | 1610-1615 |
Number of pages | 6 |
Journal | Advanced Materials |
Volume | 24 |
Issue number | 12 |
DOIs | |
State | Published - Mar 22 2012 |
Externally published | Yes |
Keywords
- PbZr Ti O
- dielectric materials
- epitaxial heterostructures
- ferroelectrics
- hard mask