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Enhanced analytic noise model for RF CMOS design
Jim Koeppe
,
Ramesh Harjani
Electrical and Computer Engineering
Research output
:
Contribution to journal
›
Conference article
›
peer-review
4
Scopus citations
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Keyphrases
Channel Length
100%
Noise Model
100%
CMOS Design
100%
RF CMOS
100%
Physics-based
50%
Model Accuracy
50%
Noise Study
50%
CMOS Process
50%
Noise Parameters
50%
Excess Noise Factor
50%
CMOS Devices
50%
Noise Theory
50%
Circuit Simulator
50%
CMOS Transistor
50%
Short Channel
50%
Hand Calculation
50%
RF Noise
50%
De-embedding
50%
Experimental Noise
50%
Engineering
Channel Length
100%
Process Parameter
50%
Noise Factor
50%
Physics
Physics
100%
Set Theory
100%