EMITTANCE OF OXIDE LAYERS ON A METAL SUBSTRATE

JR RR BRANNON JR RR, RJ GOLDSTEIN RJ

Research output: Chapter in Book/Report/Conference proceedingChapter

25 Scopus citations

Abstract

Variation of total normal emittance as a function of oxide thickness on a metal substrate is investigated experimentally for Al- Al//2O//3 and Cu-CuO systems. The measurements are made using a comparative black-body technique. Over the range of aluminum- oxide thicknesses investigated (1. 2 to 86. 4 U) the total normal emittance varies from 0. 15 to 0. 92 for a sample temperature of 96 C. An analytical solution to the foregoing problem is formulated and the total normal emittance of the anodized aluminum samples is computed.

Original languageEnglish (US)
Title of host publicationJournal of Heat Transfer, Transactions ASME
Pages257-263
Number of pages7
Volume92 Ser C
Edition2
StatePublished - May 1970
EventUnknown conference -
Duration: Nov 16 1969Nov 21 1969

Other

OtherUnknown conference
Period11/16/6911/21/69

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    BRANNON JR RR, JR. RR., & GOLDSTEIN RJ, RJ. (1970). EMITTANCE OF OXIDE LAYERS ON A METAL SUBSTRATE. In Journal of Heat Transfer, Transactions ASME (2 ed., Vol. 92 Ser C, pp. 257-263)