Ellipsometric study of aluminum-nickel nano-films for plasmonic application

Husam H. Abu-Safe; Issra Hammoudeh; Husam Al-Nasser; Timothy A. Morgan; Morgan E. Ware; Radwan A. Al Faouri; Hameed Naseem

doi:10.1117/12.2318981

Ellipsometric study of aluminum-nickel nano-films for plasmonic application

Husam H. Abu-Safe
, Issra Hammoudeh
, Husam Al-Nasser
, Timothy A. Morgan
, Morgan E. Ware
, Radwan A. Al Faouri
, Hameed Naseem

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

3 Scopus citations

Abstract

Aluminum-nickel nano-alloys were prepared by successive evaporation of nickel and aluminum ultra-thin films on silicon and glass substrates at room temperature. Alloying was obtained through the spontaneous intermixing of the ultra-thin layers at room temperature. The shift in the X-ray photoelectron spectroscopy (XPS) peaks of the pure metals indicated the alloying process in the films. Using spectroscopic ellipsometry from the UV to near infrared spectral range, the optical properties of these films were investigated. The effective pseudo-dielectric functions obtained by direct inversion of the ellipsometry spectra reveled a surface plasmon resonance at 364 nm in the prepared alloys. The resonance peak was pronounced for the pure nickel films and it did not suffer any spectral shift when the films were alloyed with aluminum. Interpretations of this behavior is presented.

Original language	English (US)
Title of host publication	Nanostructured Thin Films XI
Editors	Tom G. Mackay, Akhlesh Lakhtakia
Publisher	SPIE
ISBN (Electronic)	9781510620339
DOIs	https://doi.org/10.1117/12.2318981
State	Published - 2018
Externally published	Yes
Event	Nanostructured Thin Films XI 2018 - San Diego, United States Duration: Aug 22 2018 → Aug 23 2018

Publication series

Name	Proceedings of SPIE - The International Society for Optical Engineering
Volume	10731
ISSN (Print)	0277-786X
ISSN (Electronic)	1996-756X

Conference

Conference	Nanostructured Thin Films XI 2018
Country/Territory	United States
City	San Diego
Period	8/22/18 → 8/23/18

Bibliographical note

Publisher Copyright:
© 2018 SPIE.

Keywords

Aluminum-nickel
nano-alloys
spectroscopic ellipsometry
surface plasmon resonance

Publisher link

10.1117/12.2318981

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Cite this

Abu-Safe, H. H., Hammoudeh, I., Al-Nasser, H., Morgan, T. A., Ware, M. E., Al Faouri, R. A., & Naseem, H. (2018). Ellipsometric study of aluminum-nickel nano-films for plasmonic application. In T. G. Mackay, & A. Lakhtakia (Eds.), Nanostructured Thin Films XI Article 107310J (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 10731). SPIE. https://doi.org/10.1117/12.2318981

Ellipsometric study of aluminum-nickel nano-films for plasmonic application. / Abu-Safe, Husam H.; Hammoudeh, Issra; Al-Nasser, Husam et al.
Nanostructured Thin Films XI. ed. / Tom G. Mackay; Akhlesh Lakhtakia. SPIE, 2018. 107310J (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 10731).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abu-Safe, HH, Hammoudeh, I, Al-Nasser, H, Morgan, TA, Ware, ME, Al Faouri, RA & Naseem, H 2018, Ellipsometric study of aluminum-nickel nano-films for plasmonic application. in TG Mackay & A Lakhtakia (eds), Nanostructured Thin Films XI., 107310J, Proceedings of SPIE - The International Society for Optical Engineering, vol. 10731, SPIE, Nanostructured Thin Films XI 2018, San Diego, United States, 8/22/18. https://doi.org/10.1117/12.2318981

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title = "Ellipsometric study of aluminum-nickel nano-films for plasmonic application",

abstract = "Aluminum-nickel nano-alloys were prepared by successive evaporation of nickel and aluminum ultra-thin films on silicon and glass substrates at room temperature. Alloying was obtained through the spontaneous intermixing of the ultra-thin layers at room temperature. The shift in the X-ray photoelectron spectroscopy (XPS) peaks of the pure metals indicated the alloying process in the films. Using spectroscopic ellipsometry from the UV to near infrared spectral range, the optical properties of these films were investigated. The effective pseudo-dielectric functions obtained by direct inversion of the ellipsometry spectra reveled a surface plasmon resonance at 364 nm in the prepared alloys. The resonance peak was pronounced for the pure nickel films and it did not suffer any spectral shift when the films were alloyed with aluminum. Interpretations of this behavior is presented.",

keywords = "Aluminum-nickel, nano-alloys, spectroscopic ellipsometry, surface plasmon resonance",

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doi = "10.1117/12.2318981",

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AU - Abu-Safe, Husam H.

AU - Hammoudeh, Issra

AU - Al-Nasser, Husam

AU - Morgan, Timothy A.

AU - Ware, Morgan E.

AU - Al Faouri, Radwan A.

AU - Naseem, Hameed

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N2 - Aluminum-nickel nano-alloys were prepared by successive evaporation of nickel and aluminum ultra-thin films on silicon and glass substrates at room temperature. Alloying was obtained through the spontaneous intermixing of the ultra-thin layers at room temperature. The shift in the X-ray photoelectron spectroscopy (XPS) peaks of the pure metals indicated the alloying process in the films. Using spectroscopic ellipsometry from the UV to near infrared spectral range, the optical properties of these films were investigated. The effective pseudo-dielectric functions obtained by direct inversion of the ellipsometry spectra reveled a surface plasmon resonance at 364 nm in the prepared alloys. The resonance peak was pronounced for the pure nickel films and it did not suffer any spectral shift when the films were alloyed with aluminum. Interpretations of this behavior is presented.

AB - Aluminum-nickel nano-alloys were prepared by successive evaporation of nickel and aluminum ultra-thin films on silicon and glass substrates at room temperature. Alloying was obtained through the spontaneous intermixing of the ultra-thin layers at room temperature. The shift in the X-ray photoelectron spectroscopy (XPS) peaks of the pure metals indicated the alloying process in the films. Using spectroscopic ellipsometry from the UV to near infrared spectral range, the optical properties of these films were investigated. The effective pseudo-dielectric functions obtained by direct inversion of the ellipsometry spectra reveled a surface plasmon resonance at 364 nm in the prepared alloys. The resonance peak was pronounced for the pure nickel films and it did not suffer any spectral shift when the films were alloyed with aluminum. Interpretations of this behavior is presented.

KW - Aluminum-nickel

KW - nano-alloys

KW - spectroscopic ellipsometry

KW - surface plasmon resonance

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T3 - Proceedings of SPIE - The International Society for Optical Engineering

BT - Nanostructured Thin Films XI

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ER -

Ellipsometric study of aluminum-nickel nano-films for plasmonic application

Abstract

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