Abstract
In the present work, CZTS thin films have been prepared by sulfurization of electrodeposited Cu-Zn-Sn (CZT) precursor. Prior to sulfurization, as-deposited CZT precursors have been soft annealed in Ar atmosphere at different temperatures (250-350 C). The structural, morphological, compositional and optical properties of the films have been investigated in detail. It is found that, soft annealing temperature has a significant impact on the properties of CZTS thin films. The systematic study on the improvement in the properties of CZTS films using soft annealing route has been studied and discussed.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 74-80 |
| Number of pages | 7 |
| Journal | Applied Surface Science |
| Volume | 283 |
| DOIs | |
| State | Published - Oct 15 2013 |
| Externally published | Yes |
Bibliographical note
Funding Information:This work is supported by the Human Resources Development program (No. 20124010203180) of the Korea Institute of Energy Technology Evaluation and Planning (KETEP) grant funded by the Korea government Ministry of Trade, Industry and Energy. This work is partially funded by the Center for Inorganic Photovoltaic Materials (No. 2012-0001170) grant funded by the Korea government (MEST).
Keywords
- Cyclic voltammetry (CV)
- Electrodeposition
- Soft annealing
- X-ray diffraction