Electrosynthesis of CZTS films by sulfurization of CZT precursor: Effect of soft annealing treatment

K. V. Gurav, S. M. Pawar, Seung Wook Shin, M. P. Suryawanshi, G. L. Agawane, P. S. Patil, Jong Ha Moon, J. H. Yun, Jin Hyeok Kim

Research output: Contribution to journalArticlepeer-review

87 Scopus citations

Abstract

In the present work, CZTS thin films have been prepared by sulfurization of electrodeposited Cu-Zn-Sn (CZT) precursor. Prior to sulfurization, as-deposited CZT precursors have been soft annealed in Ar atmosphere at different temperatures (250-350 C). The structural, morphological, compositional and optical properties of the films have been investigated in detail. It is found that, soft annealing temperature has a significant impact on the properties of CZTS thin films. The systematic study on the improvement in the properties of CZTS films using soft annealing route has been studied and discussed.

Original languageEnglish (US)
Pages (from-to)74-80
Number of pages7
JournalApplied Surface Science
Volume283
DOIs
StatePublished - Oct 15 2013

Keywords

  • Cyclic voltammetry (CV)
  • Electrodeposition
  • Soft annealing
  • X-ray diffraction

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