Electronic Structure of New Line Defect in Strained NdTiO3 on SrTiO3

Jong Seok Jeong, Mehmet Topsakal, Peng Xu, Renata M. Wentzcovitch, Bharat Jalan, K. Andre Mkhoyan

Research output: Contribution to journalComment/debate

Original languageEnglish (US)
Pages (from-to)2073-2074
Number of pages2
JournalMicroscopy and Microanalysis
Volume21
Issue numberS3
DOIs
StatePublished - Jan 1 2015

Fingerprint

Electronic structure
electronic structure
Defects
defects

How much support was provided by MRSEC?

  • Shared

Cite this

Electronic Structure of New Line Defect in Strained NdTiO3 on SrTiO3. / Seok Jeong, Jong; Topsakal, Mehmet; Xu, Peng; Wentzcovitch, Renata M.; Jalan, Bharat; Andre Mkhoyan, K.

In: Microscopy and Microanalysis, Vol. 21, No. S3, 01.01.2015, p. 2073-2074.

Research output: Contribution to journalComment/debate

Seok Jeong, Jong ; Topsakal, Mehmet ; Xu, Peng ; Wentzcovitch, Renata M. ; Jalan, Bharat ; Andre Mkhoyan, K. / Electronic Structure of New Line Defect in Strained NdTiO3 on SrTiO3. In: Microscopy and Microanalysis. 2015 ; Vol. 21, No. S3. pp. 2073-2074.
@article{a74e9c8370c7444a9b18f30cc0f096c1,
title = "Electronic Structure of New Line Defect in Strained NdTiO3 on SrTiO3",
author = "{Seok Jeong}, Jong and Mehmet Topsakal and Peng Xu and Wentzcovitch, {Renata M.} and Bharat Jalan and {Andre Mkhoyan}, K.",
year = "2015",
month = "1",
day = "1",
doi = "10.1017/S1431927615011149",
language = "English (US)",
volume = "21",
pages = "2073--2074",
journal = "Microscopy and Microanalysis",
issn = "1431-9276",
publisher = "Cambridge University Press",
number = "S3",

}

TY - JOUR

T1 - Electronic Structure of New Line Defect in Strained NdTiO3 on SrTiO3

AU - Seok Jeong, Jong

AU - Topsakal, Mehmet

AU - Xu, Peng

AU - Wentzcovitch, Renata M.

AU - Jalan, Bharat

AU - Andre Mkhoyan, K.

PY - 2015/1/1

Y1 - 2015/1/1

UR - http://www.scopus.com/inward/record.url?scp=84994666758&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84994666758&partnerID=8YFLogxK

U2 - 10.1017/S1431927615011149

DO - 10.1017/S1431927615011149

M3 - Comment/debate

AN - SCOPUS:84994666758

VL - 21

SP - 2073

EP - 2074

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

SN - 1431-9276

IS - S3

ER -