Electronic charge densities at valence and conduction band edges of ZnSe and CdTe

Renata M. Wentzcovitch, Steven L. Richardson, Marvin L. Cohen

Research output: Contribution to journalArticlepeer-review

18 Scopus citations

Abstract

The empirical pseudopotential method (EPM) is used to calculate electronic charge densities at selected k points of the valence and conduction band edges of two II-VI semiconductors: ZnSe and CdTe.

Original languageEnglish (US)
Pages (from-to)203-206
Number of pages4
JournalPhysics Letters A
Volume114
Issue number4
DOIs
StatePublished - Feb 17 1986

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