Electron-phonon interaction in N-doped cuprates: An inelastic x-ray scattering study

M. D'Astuto, P. K. Mang, P. Giura, A. Shukla, A. Mirone, M. Krisch, F. Sette, P. Ghigna, M. Braden, M. Greven

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Abstract

Inelastic x-ray scattering (IXS) with very high (meV) energy resolution has become a valuable spectroscopic tool, complementing the well established coherent inelastic neutron scattering (INS) technique for phonon dispersion investigations. In the study of crystalline systems IXS is a viable alternative to INS, especially in cases where only small samples are available. Using IXS, we have measured the phonon dispersion of Nd1.86Ce0.14CuO4+δ along the [ξ, 0, 0] and [ξ, ξ, 0] inplane directions. Compared to the undoped parent compound, the two highest longitudinal optical (LO) phonon branches are shifted to lower energies because of Coulomb-screening effects brought about by the doped charge carriers. An additional anomalous softening of the highest branch is observed around q = (0-2, 0, 0). This anomalous softening, akin to what has been observed in other compounds, provides evidence for a strong electron-phonon coupling in the electron-doped high-temperature superconductors.

Original languageEnglish (US)
Pages (from-to)484-492
Number of pages9
JournalInternational Journal of Modern Physics B
Volume17
Issue number4-6 I
DOIs
StatePublished - Mar 10 2003

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    D'Astuto, M., Mang, P. K., Giura, P., Shukla, A., Mirone, A., Krisch, M., Sette, F., Ghigna, P., Braden, M., & Greven, M. (2003). Electron-phonon interaction in N-doped cuprates: An inelastic x-ray scattering study. International Journal of Modern Physics B, 17(4-6 I), 484-492. https://doi.org/10.1142/s0217979203016133