Skip to main navigation Skip to search Skip to main content

Electron doping by charge transfer at LaFeO3/Sm 2CuO4 epitaxial interfaces

  • Flavio Y. Bruno
  • , Rainer Schmidt
  • , Maria Varela
  • , Javier Garcia-Barriocanal
  • , Alberto Rivera-Calzada
  • , Fabian A. Cuellar
  • , Carlos Leon
  • , Pardeep Thakur
  • , Julio C. Cezar
  • , Nicholas B. Brookes
  • , Mar Garcia-Hernandez
  • , Elbio Dagotto
  • , Stephen J. Pennycook
  • , Jacobo Santamaria

Research output: Contribution to journalArticlepeer-review

Abstract

Using X-ray absorption spectroscopy and electron energy loss spectroscopy with atomic-scale spatial resolution, experimental evidence for charge transfer at the interface between the Mott insulators Sm2CuO4 and LaFeO3 is obtained. As a consequence of the charge transfer, the Sm2CuO4 is doped with electrons and thus epitaxial Sm 2CuO4/LaFeO3 heterostructures become metallic.

Original languageEnglish (US)
Pages (from-to)1468-1473
Number of pages6
JournalAdvanced Materials
Volume25
Issue number10
DOIs
StatePublished - Mar 13 2013

Keywords

  • charge transfer
  • interface phenomena
  • superlattices

Fingerprint

Dive into the research topics of 'Electron doping by charge transfer at LaFeO3/Sm 2CuO4 epitaxial interfaces'. Together they form a unique fingerprint.

Cite this