Electron Diffraction and Microscopy Studies of the Structure of Grain Boundaries in Al2O3

C. B. CARTER, D. L. KOHLSTEDT, S. L. SASS

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Abstract

Electron diffraction and weak‐beam imaging techniques were used to examine the structure and thickness of grain boundaries in polycrystalline Al2O3. Extra diffraction spots from boundaries inclined to the foil surface were detected and related to the periodic structure of the boundary. Relrods from edge‐on boundaries were detected and used to estimate the thickness of the boundary region, i.e. the depth that the displacement field of the boundary penetrates into the two crystals adjacent to the interface.

Original languageEnglish (US)
Pages (from-to)623-627
Number of pages5
JournalJournal of the American Ceramic Society
Volume63
Issue number11-12
DOIs
StatePublished - Nov 1980

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