Electromigration inside logic cells: Modeling, analyzing and mitigating signal electromigration in NanoCMOS

Gracieli Posser, Sachin S Sapatnekar, Ricardo Reis

Research output: Book/ReportBook

2 Scopus citations

Fingerprint

Dive into the research topics of 'Electromigration inside logic cells: Modeling, analyzing and mitigating signal electromigration in NanoCMOS'. Together they form a unique fingerprint.

Engineering & Materials Science