Electromigration-Induced Bit-Error-Rate Degradation of Interconnect Signal Paths Characterized from a 16nm Test Chip

Nakul Pande, C. Zhou, M. H. Lin, R. Fung, R. Wong, S. Wen, C. H. Kim

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

3 Scopus citations

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Engineering