Abstract
We propose two practical approaches for on-chip inductance extraction to obtain a highly sparsified and accurate inverse inductance matrix K. Both approaches differ from previous methods in that they use circuit characteristics to obtain a sparse, stable and symmetric K, using the concept of resistance-dominant and inductance-dominant lines. Specifically, they begin by finding inductance-dominant lines and forming initial clusters, followed by heuristically enlarging and/or combining these clusters, with the goal of including only the important inductance terms in the sparsifted K matrix. Algorithm 1 permits the influence of the magnetic field of aggressor lines to reach the edge of the chip, while Algorithm 2 works under the simplified assumptions that the supply lines have zero ∑j Lij (dIj/dt) drops (but have nonzero parasitic Rs and Cs) and that currents cannot return through supply lines beyond a user-defined distance. For reasonable designs, Algorithm 1 delivers a sparsification of 97% for delay and oscillation magnitude errors of 10% and 15%, respectively, as compared to Algorithm 2 where the sparsification can reach 99% for the same delay error. An offshoot of this work is the development of K-PRIMA, an extension of the reduced-order modeling technique, PRIMA, to handle K matrices with guarantees of passivity.
Original language | English (US) |
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Pages (from-to) | 746-761 |
Number of pages | 16 |
Journal | IEEE Transactions on Very Large Scale Integration (VLSI) Systems |
Volume | 10 |
Issue number | 6 |
DOIs | |
State | Published - Dec 2002 |
Bibliographical note
Funding Information:Manuscript received December 12, 2001; revised June 15, 2002. This work was supported in part by the SRC by Grant 99-TJ-714 and by the NSF by Award CCR-0098117. H. Hu was with the Department of ECE, University of Minnesota, Minneapolis, MN 55455 USA. She is now with the Motorola Inc., Austin, TX 78729 USA (e-mail: [email protected]; [email protected]). S. Sapatnekar is with the Department of ECE, University of Minnesota, Minneapolis, MN 55455 USA (e-mail: [email protected]). Digital Object Identifier 10.1109/TVLSI.2002.808455
Keywords
- Circuit analysis
- Circuit simulation
- Extraction
- Inductance
- Interconnect
- Magnetic interaction
- Model-order reduction