TY - JOUR
T1 - Efficient crosstalk estimation
AU - Kuhlmann, Martin
AU - Sapatnekar, Sachin S
AU - Parhi, Keshab K
PY - 1999/12/1
Y1 - 1999/12/1
N2 - With the reducing distances between wires in deep sub-micron technologies, coupling capacitances are becoming significant as their magnitude becomes comparable to the area capacitance and fringing capacitance of a wire. This causes an increasing susceptibility to failure due to inadvertent noise, and leads to a requirement for accurate noise estimation. An incorrect estimation of the noise could lead either to circuit malfunction in case of under-estimation, or to wasted design resources due to overestimation. This paper presents a new time-efficient method for the precise estimation of crosstalk noise. While existing fast noise estimation metrics may overestimate the coupling noise by several orders of magnitude, the proposed metric computes the coupling noise with a good accuracy as compared to SPICE.
AB - With the reducing distances between wires in deep sub-micron technologies, coupling capacitances are becoming significant as their magnitude becomes comparable to the area capacitance and fringing capacitance of a wire. This causes an increasing susceptibility to failure due to inadvertent noise, and leads to a requirement for accurate noise estimation. An incorrect estimation of the noise could lead either to circuit malfunction in case of under-estimation, or to wasted design resources due to overestimation. This paper presents a new time-efficient method for the precise estimation of crosstalk noise. While existing fast noise estimation metrics may overestimate the coupling noise by several orders of magnitude, the proposed metric computes the coupling noise with a good accuracy as compared to SPICE.
UR - http://www.scopus.com/inward/record.url?scp=0033297670&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=0033297670&partnerID=8YFLogxK
M3 - Article
AN - SCOPUS:0033297670
SN - 1063-6404
SP - 266
EP - 272
JO - Proceedings - IEEE International Conference on Computer Design: VLSI in Computers and Processors
JF - Proceedings - IEEE International Conference on Computer Design: VLSI in Computers and Processors
ER -