Efficient approach to pseudo-exhaustive test generation for BIST design

Chien In H Chen, Gerald E. Sobelman

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Scopus citations

Abstract

In the built-in self-test (BIST) methodology, the two major problems which must be addressed are test generation and response analysis. An efficient, unified solution to the problem of test generation is presented. A design procedure that is computationally efficient and produces test generation circuitry with low hardware overhead is proposed. The effectiveness of this approach is demonstrated by detailed comparisons of its results with those that would be obtained by existing techniques.

Original languageEnglish (US)
Title of host publicationProceedings - IEEE International Conference on Computer Design
Subtitle of host publicationVLSI in Computers and Processors
Editors Anon
PublisherPubl by IEEE
Pages576-579
Number of pages4
StatePublished - Dec 1 1989
EventProceedings - 1989 IEEE International Conference on Computer Design: VLSI in Computers & Processors - Cambridge, MA, USA
Duration: Oct 2 1989Oct 4 1989

Other

OtherProceedings - 1989 IEEE International Conference on Computer Design: VLSI in Computers & Processors
CityCambridge, MA, USA
Period10/2/8910/4/89

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