Efficient and accurate testing of on-chip ADC based on ATE

Shu Hua Wei, Lan Dai, Xiao Bo Zhang, Yan Feng Jiang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The embedded digital-analog mixed-signal circuit testing has become one of the difficulties to be solved. In this paper, a SoC embedded ADC has been tested based on the Credence Gemini500 verification system. The testing method is studied and verified through the test experiment and results. This testing method is an important reference for general embedded IP core testing.

Original languageEnglish (US)
Title of host publicationVehicle, Mechatronics and Information Technologies
Pages3378-3381
Number of pages4
DOIs
StatePublished - Oct 7 2013
Event2013 International Conference on Vehicle and Mechanical Engineering and Information Technology, VMEIT 2013 - Zhengzhou, Henan, China
Duration: Aug 17 2013Aug 18 2013

Publication series

NameApplied Mechanics and Materials
Volume380-384
ISSN (Print)1660-9336
ISSN (Electronic)1662-7482

Other

Other2013 International Conference on Vehicle and Mechanical Engineering and Information Technology, VMEIT 2013
CountryChina
CityZhengzhou, Henan
Period8/17/138/18/13

Keywords

  • ADC testing
  • ATE
  • Mixed-signal
  • SoC

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  • Cite this

    Wei, S. H., Dai, L., Zhang, X. B., & Jiang, Y. F. (2013). Efficient and accurate testing of on-chip ADC based on ATE. In Vehicle, Mechatronics and Information Technologies (pp. 3378-3381). (Applied Mechanics and Materials; Vol. 380-384). https://doi.org/10.4028/www.scientific.net/AMM.380-384.3378