Effects of small-angle mistilts on dopant visibility in ADF-STEM imaging of nanocrystals

Jacob T. Held; Samuel Duncan; K. Andre Mkhoyan

doi:10.1016/j.ultramic.2017.03.008

Effects of small-angle mistilts on dopant visibility in ADF-STEM imaging of nanocrystals

Jacob T. Held, Samuel Duncan, K. Andre Mkhoyan

Research output: Contribution to journal › Article › peer-review

1 Scopus citations

Abstract

Quantitative ADF-STEM imaging paired with image simulations has proven to be a powerful technique for determining the three dimensional location of substitutionally doped atoms in thin films. Expansion of this technique to lightly-doped nanocrystals requires an understanding of the influence of specimen mistilt on dopant visibility due to the difficulty of accurate orientation determination in such systems as well as crystal movement under the beam. In this study, the effects of specimen mistilt on ADF-STEM imaging are evaluated using germanium-doped silicon nanocrystals as model systems. It is shown that dopant visibility is a strong function of specimen mistilt, and the accuracy of specimen orientation is an important factor in the analysis of three-dimensional dopant location, but the sensitivity to mistilt can be weakened by increasing the STEM probe convergence angle and optimizing ADF detector inner angle.

Original language	English (US)
Pages (from-to)	53-57
Number of pages	5
Journal	Ultramicroscopy
Volume	177
DOIs	https://doi.org/10.1016/j.ultramic.2017.03.008
State	Published - Jun 1 2017

Bibliographical note

Funding Information:
This project was supported by the MRSEC program of the National Science Foundation under Award Number DMR-1420013. This project was also partially supported by the University of Minnesota Undergraduate Research Opportunities Program (UROP). The authors acknowledge the Minnesota Supercomputing Institute (MSI) at the University of Minnesota for providing resources that contributed to the research results reported within this project.

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© 2017 Elsevier B.V.

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@article{796ed41763ac402fb7eaddc1f09cdadb,

title = "Effects of small-angle mistilts on dopant visibility in ADF-STEM imaging of nanocrystals",

abstract = "Quantitative ADF-STEM imaging paired with image simulations has proven to be a powerful technique for determining the three dimensional location of substitutionally doped atoms in thin films. Expansion of this technique to lightly-doped nanocrystals requires an understanding of the influence of specimen mistilt on dopant visibility due to the difficulty of accurate orientation determination in such systems as well as crystal movement under the beam. In this study, the effects of specimen mistilt on ADF-STEM imaging are evaluated using germanium-doped silicon nanocrystals as model systems. It is shown that dopant visibility is a strong function of specimen mistilt, and the accuracy of specimen orientation is an important factor in the analysis of three-dimensional dopant location, but the sensitivity to mistilt can be weakened by increasing the STEM probe convergence angle and optimizing ADF detector inner angle.",

author = "Held, {Jacob T.} and Samuel Duncan and Mkhoyan, {K. Andre}",

note = "Funding Information: This project was supported by the MRSEC program of the National Science Foundation under Award Number DMR-1420013. This project was also partially supported by the University of Minnesota Undergraduate Research Opportunities Program (UROP). The authors acknowledge the Minnesota Supercomputing Institute (MSI) at the University of Minnesota for providing resources that contributed to the research results reported within this project. Publisher Copyright: {\textcopyright} 2017 Elsevier B.V.",

year = "2017",

month = jun,

day = "1",

doi = "10.1016/j.ultramic.2017.03.008",

language = "English (US)",

volume = "177",

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AU - Held, Jacob T.

AU - Duncan, Samuel

AU - Mkhoyan, K. Andre

N1 - Funding Information: This project was supported by the MRSEC program of the National Science Foundation under Award Number DMR-1420013. This project was also partially supported by the University of Minnesota Undergraduate Research Opportunities Program (UROP). The authors acknowledge the Minnesota Supercomputing Institute (MSI) at the University of Minnesota for providing resources that contributed to the research results reported within this project. Publisher Copyright: © 2017 Elsevier B.V.

PY - 2017/6/1

Y1 - 2017/6/1

N2 - Quantitative ADF-STEM imaging paired with image simulations has proven to be a powerful technique for determining the three dimensional location of substitutionally doped atoms in thin films. Expansion of this technique to lightly-doped nanocrystals requires an understanding of the influence of specimen mistilt on dopant visibility due to the difficulty of accurate orientation determination in such systems as well as crystal movement under the beam. In this study, the effects of specimen mistilt on ADF-STEM imaging are evaluated using germanium-doped silicon nanocrystals as model systems. It is shown that dopant visibility is a strong function of specimen mistilt, and the accuracy of specimen orientation is an important factor in the analysis of three-dimensional dopant location, but the sensitivity to mistilt can be weakened by increasing the STEM probe convergence angle and optimizing ADF detector inner angle.

AB - Quantitative ADF-STEM imaging paired with image simulations has proven to be a powerful technique for determining the three dimensional location of substitutionally doped atoms in thin films. Expansion of this technique to lightly-doped nanocrystals requires an understanding of the influence of specimen mistilt on dopant visibility due to the difficulty of accurate orientation determination in such systems as well as crystal movement under the beam. In this study, the effects of specimen mistilt on ADF-STEM imaging are evaluated using germanium-doped silicon nanocrystals as model systems. It is shown that dopant visibility is a strong function of specimen mistilt, and the accuracy of specimen orientation is an important factor in the analysis of three-dimensional dopant location, but the sensitivity to mistilt can be weakened by increasing the STEM probe convergence angle and optimizing ADF detector inner angle.

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SN - 0304-3991

VL - 177

SP - 53

EP - 57

JO - Ultramicroscopy

JF - Ultramicroscopy

ER -

Effects of small-angle mistilts on dopant visibility in ADF-STEM imaging of nanocrystals

Abstract

Bibliographical note

MRSEC Support

PubMed: MeSH publication types

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University of Minnesota MRSEC (DMR-1420013)

MRSEC IRG-2: Sustainable Nanocrystal Materials

Cite this

Effects of small-angle mistilts on dopant visibility in ADF-STEM imaging of nanocrystals

Abstract

Bibliographical note

MRSEC Support

PubMed: MeSH publication types

Publisher link

Find It

Other files and links

Fingerprint

Projects

University of Minnesota MRSEC (DMR-1420013)

MRSEC IRG-2: Sustainable Nanocrystal Materials

Cite this